7th Belle II VXD Workshop and 18th International Workshop on DEPFET Detectors and Applications

Session

PXD Parallel Session I

21 Jan 2015, 16:00

Lecture hall T1, Building T, Faculty of Mathematics and Physics, Charles University in Prague (Prague, Czech Republic)

Conveners

PXD Parallel Session I: DEPFET Sensor

• Rainer Richter (HLL)

PXD Parallel Session I: EMCM and gated mode tests

• Christian Koffmane

62. Comparison study of the influence of oxide thickness on the internal amplification

Stefan Rummel (LMU Muenchen)

21/01/2015, 16:00

63. Internal Amplification vs Oxide Thickness - Simulation results

Rainer Richter (MPI)

21/01/2015, 16:15

64. Pilot run - production status

Rainer Richter (MPI)

21/01/2015, 16:30

53. Metallization of the EMCM 3 & 4 wafers

Mr Daniel Klose (HLL)

21/01/2015, 16:45

54. Pilot run - test results after first metal

Dr Paola Avella (Max Planck Institute for Physics - Semiconductor Laboratory)

21/01/2015, 17:00

58. PXD9 IV Curves

Rainer Richter (MPI)

21/01/2015, 17:10

55. Gated Mode Tests with Hybrid 4.1

Mr Eduard Prinker (MPI for Physics)

21/01/2015, 17:20

56. Latest results of EMCM tests / measurements

Mr Felix Mueller (Max-Planck-Institute for Physics)

21/01/2015, 17:40