20th International Workshop on DEPFET Detectors and Applications

Name: 20th International Workshop on DEPFET Detectors and Applications
Start: 2016-05-11T15:00:00+00:00
End: 2016-05-14T13:30:00+00:00
Location: Kloster Seeon

11–14 May 2016

Kloster Seeon

UTC timezone

Overview
Timetable
Detailed Timeable
Registration
Participant List
Accommodation and Travel

Support: Laci and Patricia

lca@hll.mpg.de
pas@hll.mpg.de

PXD9-7 failure analysis with Light Emission Microscope (PHEMOS)

12 May 2016, 11:25

15m

Tagungsraum (Kloster Seeon)

Tagungsraum

Kloster Seeon

Klosterweg 1 D-83370 Seeon

PXD9 Pilot run, Sensor Testing

Jelena Ninkovic (MPG Halbleiterlabor)

Slides

Ninkovic_PXD9_7_phemos.pdf

20th International Workshop on DEPFET Detectors and Applications

Support: Laci and Patricia

PXD9-7 failure analysis with Light Emission Microscope (PHEMOS)

Tagungsraum

Kloster Seeon

Speaker

Presentation materials

Choose timezone

20th International Workshop on DEPFET Detectors and Applications

Support: Laci and Patricia

Speaker

Presentation materials