20th International Workshop on DEPFET Detectors and Applications

Session

Lab Tests: Pilot Testing in the Lab

13 May 2016, 09:00

Tagungsraum (Kloster Seeon)

Conveners

Lab Tests: Pilot Testing in the Lab

• Christian Koffmane (MPG HLL)

79. Hybrid 5 tests: Lab characterization and Irradiations

Botho Paschen (Belle II)

13/05/2016, 09:00

81. ASIC optimization using DEPFET transistors as current source

Mr Harrison Schreeck (University of Göttingen)

13/05/2016, 09:20

82. PXD9 - Module Testing after SMD Assembly

Mr Marçà Boronat Arevalo (IFIC)

13/05/2016, 09:40

83. PXD9 Pilot - Gated Mode Testing

Christian Koffmane (MPI Halbleiterlabor)

13/05/2016, 09:55