2nd International Workshop on DEPFET Detectors and Applications

Session

DEPFET cont. / ASIC Design and Testresults

4 May 2009, 14:00

Lecture Room (Ringberg Castle)

22. DEPFET Parameter Extraction

Andreas Wassatsch (MPI Halbleiterlabor)

04/05/2009, 14:00

4. DCD and Switcher Status

Ivan Peric (Uni Heidelberg)

04/05/2009, 14:15

14. DHP Development

Hans Krueger (Uni Bonn)

04/05/2009, 14:45

9. DCD2 Testsystem and Results

Manuel Koch (Uni Bonn)

04/05/2009, 15:05