21st International Workshop on DEPFET Detectors and Applications

Session

Module Testing

29 May 2017, 16:00

Ringberg Castle

Conveners

Module Testing

• Christian Koffmane (MPI Halbleiterlabor)

73. Gated Mode - System Aspects

Mr Felix Mueller (Max-Planck-Institute for Physics)

29/05/2017, 16:00

74. Probe Card Testing

Pablo Gomis (IFIC Valencia)

29/05/2017, 16:25

75. Interplay of EPICS, BonnDAQ, python scripts, DHE and JTAG

Botho Paschen (University of Bonn)

29/05/2017, 16:40

76. Automation of mass testing (coding guidelines, etc. and Slow Control)

Mr Harrison Schreeck (University of Göttingen), Mr Philipp Wieduwilt (Universität Göttingen)

29/05/2017, 17:00

77. Mass Testing

Philipp Leitl (Max Planck for Physics)

29/05/2017, 17:25

78. Characterization of the Belle II final chipset and matrix on Hybrid 5

Barbara Leibrock (University of Bonn)

29/05/2017, 17:45