21st International Workshop on DEPFET Detectors and Applications

Session

ASICs

29 May 2017, 11:00

Ringberg Castle

Conveners

ASICs

• Ivan Peric (KIT)

85. DCD and SWITCHER Tests

Mr Roberto Blanco (KIT)

29/05/2017, 11:00

86. DCDS the new low power readout chip

Prof. Ivan Peric (KIT)

29/05/2017, 11:15

93. Signal integrity of the PXD9-EMCM2 modules

Mr Leonard Germic (University of Bonn)

29/05/2017, 11:25