3rd International Workshop on DEPFET Detectors and Applications

Session

DEPFET

7 Oct 2009, 11:00

Lecture Room (Barcelona University)

32. PXD6 - Design and Technology Status

Rainer Richter

07/10/2009, 11:00

33. Radiation Test Plans

Andreas Ritter

07/10/2009, 11:20

34. Alternative Readout Schemes from ILC to Belle II

Stefan Rummel

07/10/2009, 11:35

35. DCD Measurements with Matrix

Manuel Koch

07/10/2009, 11:50

36. DCD - Single vs Double Sampling

Ivan Peric

07/10/2009, 12:05

37. Discussion: Do we have to change the Readout Scheme?

07/10/2009, 12:20