DEPFET Test Beam Analysis Workshop

Session

TB Analysis: Basic Results

16 Apr 2010, 09:00

Seminar room on yellow floor (Universitaet Goettingen)

3. Edge Effect and Gain Correction

Peter Kvasnicka (IPNP, Charles University, Prague)

16/04/2010, 09:00

4. Extraction of DEPFET Sensor Resolution

Peter Kvasnicka (IPNP, Charles University, Prague)

16/04/2010, 09:20

5. Status of Goettingen TB Analysis

Mr Christian Geisler (Uni Goettingen)

16/04/2010, 09:40

6. TB Software

Julia Fourletova

16/04/2010, 09:50

7. Discussion

Dr Marcel Vos (IFIC Valencia)

16/04/2010, 10:10