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14:00
the SIMPL characterisation
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Christian Jendrysik
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14:15
Data Analysis for DEPFETs
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Thomas Lauf
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14:35
Integration of DEPFET model in Transistor model
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14:55
Qualification and Selection of eRosita CCDs
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Gabriele Schächner
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15:15
X-Ray detector entrance windows
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Stefanie Ebermayer
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15:35
Measurements with DEPFETRNDR detectors and math. descr.
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Alexander Bähr