16th International Workshop on DEPFET Detectors and Applications

Name: 16th International Workshop on DEPFET Detectors and Applications
Start: 2014-05-25T15:00:00+00:00
End: 2014-05-28T13:30:00+00:00
Location: Kloster Seeon

25–28 May 2014

Kloster Seeon

UTC timezone

Overview
Timetable
Detailed Timeable
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Accommodation and Travel

Support: Patricia and Laci

pas@hll.mpg.de
lca@hll.mpg.de

Electrical Test of EMCM

27 May 2014, 09:30

30m

Tagungsraum (Kloster Seeon)

Tagungsraum

Kloster Seeon

Klosterweg 1 D-83370 Seeon

Lab Tests: PXD6 and EMCM

Mr Felix Mueller (Max-Planck-Institute for Physics)

Slides

MUELLER,_Felix_-_Electrical_Test_of_EMCM.pdf

16th International Workshop on DEPFET Detectors and Applications

Support: Patricia and Laci

Electrical Test of EMCM

Tagungsraum

Kloster Seeon

Speaker

Primary author

Presentation materials

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16th International Workshop on DEPFET Detectors and Applications

Support: Patricia and Laci

Speaker

Primary author

Presentation materials