16th International Workshop on DEPFET Detectors and Applications

Name: 16th International Workshop on DEPFET Detectors and Applications
Start: 2014-05-25T15:00:00+00:00
End: 2014-05-28T13:30:00+00:00
Location: Kloster Seeon

25–28 May 2014

Kloster Seeon

UTC timezone

Overview
Timetable
Detailed Timeable
Registration
Participant List
Accommodation and Travel

Support: Patricia and Laci

pas@hll.mpg.de
lca@hll.mpg.de

PXD9 wafer-level testing plans

26 May 2014, 12:00

30m

Tagungsraum (Kloster Seeon)

Tagungsraum

Kloster Seeon

Klosterweg 1 D-83370 Seeon

PXD9 Update, Metal System Optimization, Sensor Testing

Dr Paola Avella (Max Planck Institute for Physics - Semiconductor Laboratory)

Slides

Seeon_PA_260514_v3.pdf

16th International Workshop on DEPFET Detectors and Applications

Support: Patricia and Laci

PXD9 wafer-level testing plans

Tagungsraum

Kloster Seeon

Speaker

Presentation materials

Choose timezone

16th International Workshop on DEPFET Detectors and Applications

Support: Patricia and Laci

Speaker

Presentation materials