16th International Workshop on DEPFET Detectors and Applications

Session

PXD9 Update, Metal System Optimization, Sensor Testing

26 May 2014, 11:00

Tagungsraum (Kloster Seeon)

Conveners

PXD9 Update, Metal System Optimization, Sensor Testing

• Rainer Richter (MPG HLL)

35. PXD9 Production Status - first Yield Estimations

Rainer Richter (MPI)

26/05/2014, 11:00

36. Testing of EMCM-3-2 on Wafer Level

Andreas Ritter (Max-Planck-Institut für Physik - Halbleiterlabor)

26/05/2014, 11:30

37. PXD9 wafer-level testing plans

Dr Paola Avella (Max Planck Institute for Physics - Semiconductor Laboratory)

26/05/2014, 12:00