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16th International Workshop on DEPFET Detectors and Applications

Name: 16th International Workshop on DEPFET Detectors and Applications
Start: 2014-05-25T15:00:00+00:00
End: 2014-05-28T13:30:00+00:00
Location: Kloster Seeon

25–28 May 2014

Kloster Seeon

UTC timezone

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Support: Patricia and Laci

pas@hll.mpg.de
lca@hll.mpg.de

Session

Lab Tests: PXD6 and EMCM

27 May 2014, 09:00

Tagungsraum (Kloster Seeon)

Tagungsraum

Kloster Seeon

Klosterweg 1 D-83370 Seeon

Lab Tests: PXD6 and EMCM

Christian Koffmane (MPI Halbleiterlabor)

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Tue 27/05

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09:00

10:00

Florian Lütticke

Hybrid 6 Tests

Tagungsraum, Kloster Seeon

09:00 - 09:30

Mr Felix Mueller

Electrical Test of EMCM

Tagungsraum, Kloster Seeon

09:30 - 10:00

Christian Koffmane

Remark on the regular DEPFET Lab SeeVogh Meetings

Tagungsraum, Kloster Seeon

10:00 - 10:05

Updating the timetable...

16th International Workshop on DEPFET Detectors and Applications

Support: Patricia and Laci

Session

Lab Tests: PXD6 and EMCM

Tagungsraum

Kloster Seeon

Conveners

Lab Tests: PXD6 and EMCM

Presentation materials