11th European Symposium on Semiconductor Detectors

Session

Coffee Break and Poster Session III

10 Jun 2009, 10:40

Main Auditorium (Wildbad Kreuth)

101. A Fast Event-Preprocessor and Sequencer for the Simbol-X Low Energy Detector

Chris Tenzer (University of Tuebingen)

10/06/2009, 10:40

131. A planar position sensitive Si(Li)-detector for Compton polarimetry and Compton imaging

Uwe Spillmann (GSI)

10/06/2009, 10:40

105. Capacitance and electric field analytical calculations in strip semiconductor detectors

Paolo Walter Cattaneo (INFN Pavia)

10/06/2009, 10:40

98. Characterisation of an adaptive gain silicon microstrip readout chip.

Aldo Mozzanica (Paul Scherrer Institut)

10/06/2009, 10:40

110. Comparative study of PIN photodiodes for a low energy X-ray sensor between manufactured with three diverse wafer resistivity

Shin-Woong Park (Korea University)

10/06/2009, 10:40

93. Comparison of events reconstruction techniques in imaging detectors based on signal sharing

Carlo Fiorini (Politecnico di Milano - INFN)

10/06/2009, 10:40

109. Computer Simulation of Radiation Defect in Nanosandwich for Detection Applications

Arkady Ilyin (Kazakh National University)

10/06/2009, 10:40

94. Current Readout strategy for XFEL DEPFET detector

Carlo Fiorini (Politecnico di Milano - INFN)

10/06/2009, 10:40

96. DAQ system for pixel detectors R&D

Piero Giubilato (LBNL)

10/06/2009, 10:40

128. Duo-lateral 2D position-sensitive radiation (particle) detectors made of single crystal CVD diamond

Michal Pomorski (CEA-Sacaly)

10/06/2009, 10:40

123. Encapsulated Germanium Detector with Electromechanical Cooling

Ivan Kojouharov (GSI)

10/06/2009, 10:40

106. Enhanced radiation tolerance of Si detectors by addition of gold impurities: A simulation study

Ariel Pablo Cedola (National University of La Plata)

10/06/2009, 10:40

119. Epitaxial GaAs for X-ray detection

Jacques Bourgoin (GESEC R&D Inc.)

10/06/2009, 10:40

125. Fabrication of p-CdTe Schottky Detectors with Low Surface Leakage Current

Palat Ushasree Meethale (Durham University)

10/06/2009, 10:40

100. Full differential front-end electronic for CMOS detectors.

Piotr Sitek

10/06/2009, 10:40

104. Impact of detector parameters on Light Charged Particle identification through pulse-shape analysis

Andrea Castoldi (Politecnico di Milano)

10/06/2009, 10:40

88. Improved Coincidence Rejection For Silicon Drift Detectors

Richard Mott (PulseTor LLC)

10/06/2009, 10:40

97. Introducing 65 nm CMOS technology in low-noise read-out of semiconductor detectors

Massimo Manghisoni (University of Bergamo)

10/06/2009, 10:40

121. Investigation of Lead Telluride Schottky Diode for Nuclear Radiation Detector Application

Geehyun Kim (University of Michigan)

10/06/2009, 10:40

111. Modelling the generation and dynamics of signal electrons in pixelized Si X-ray detectors

Georg Weidenspointner (HLL - MPI Halbleiterlabor)

10/06/2009, 10:40

112. Nano5 - advancing radiation and particle transport schemes in Geant4

Georg Weidenspointner (HLL - MPI Halbleiterlabor)

10/06/2009, 10:40

113. NIR sensitivity enhancement by Laser Treatment for Si Detectors

Koei Yamamoto (Hamamatsu Photonics k.k)

10/06/2009, 10:40

99. Noise analysis of the Charge Sensitive Amplifier(CSA) for Photodetection

Shin-Woong Park (Korea University)

10/06/2009, 10:40

116. Performance of n^+-in-n Pixel Sensors at Highest Fluences

Daniel Muenstermann (TU Dortmund)

10/06/2009, 10:40

122. Planar and Semi-Planar Segmented HPGe Detectors for DESPEC Imaging Gamma-Array

Ivan Kojouharov (GSI)

10/06/2009, 10:40

129. Planar Si(Li) detectors with a large active volume

Viacheslav Sandukovsky (Joint Institute for Nuclear Rsearch)

10/06/2009, 10:40

95. Proposal of a fast readout logic for large pixel devices

Alessandro Gabrielli (INFN and University of Bologna)

10/06/2009, 10:40

92. Readout ASICs for Silicon Drift Detectors

Carlo Fiorini (Politecnico di Milano - INFN)

10/06/2009, 10:40

130. Rietveld Refinement for the Crystal Structure of Ga2Se3

Konstantin Savchenko (National Scientific Center “ISSAR”, NAAS of Ukraine)

10/06/2009, 10:40

114. Simulative analysis of Backscatter Factors(BSFs) for low energy X-ray

Sunwoo Yuk (Korea Orthopedic & Rehabilitation Engineering Center)

10/06/2009, 10:40

108. Study of frequency-dependent interstrip admittance in silicon microstrip detectors

Gabriele Giacomini (FBK-irst)

10/06/2009, 10:40

117. Study of p-type fast neutron irradiated silicon diodes

Oleksiy Lytovchenko (INFN, Padova)

10/06/2009, 10:40

120. Surface Characterisation and Treatment Evaluation of Germanium Crystals

Tobias Engert (GSI)

10/06/2009, 10:40

102. Surface morphology and structure of porous silicon fabricated by vapor phase chemical etching

Diana Adliene (Kaunas University of Technology)

10/06/2009, 10:40

118. Temperature dependence of AlGaAs soft X-ray detectors

Aidan Matthew Barnett (University of Leicester)

10/06/2009, 10:40

126. The CdTe and CdZnTe single crystals growth essential X-ray imaging

Marina Dmitrievna Pavlyuk (Russian Academy of Sciences)

10/06/2009, 10:40

91. The readout electronics for eROSITA pnCCD testing

Johannes Elbs (MPI Halbleiterlabor)

10/06/2009, 10:40

127. The Research of Polarization in CdTe P-I-N Detectors and Development of Detecting Units for High Resolution Spectroscopy

Yury Petukhov (Center of Radiation and Nuclear Safety (RNIIRP) Ltd)

10/06/2009, 10:40

107. The van Roosbroeck system, its mathematical properties, their use in simulation tools, and detector simulation examples

Klaus Gärtner (WIAS-Berlin)

10/06/2009, 10:40

103. Theoritical characterization of neutron semiconductor detector

Djelloul Benzaid

10/06/2009, 10:40