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10:40
A planar position sensitive Si(Li)-detector for Compton polarimetry and Compton imaging
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Uwe Spillmann
(GSI)
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10:40
Rietveld Refinement for the Crystal Structure of Ga2Se3
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Konstantin Savchenko
(National Scientific Center “ISSAR”, NAAS of Ukraine)
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10:40
Surface Characterisation and Treatment Evaluation of Germanium Crystals
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Tobias Engert
(GSI)
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10:40
Investigation of Lead Telluride Schottky Diode for Nuclear Radiation Detector Application
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Geehyun Kim
(University of Michigan)
-
10:40
Planar and Semi-Planar Segmented HPGe Detectors for DESPEC Imaging Gamma-Array
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Ivan Kojouharov
(GSI)
-
10:40
Encapsulated Germanium Detector with Electromechanical Cooling
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Ivan Kojouharov
(GSI)
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10:40
Fabrication of p-CdTe Schottky Detectors with Low Surface Leakage Current
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Palat Ushasree Meethale
(Durham University)
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10:40
The CdTe and CdZnTe single crystals growth essential X-ray imaging
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Marina Dmitrievna Pavlyuk
(Russian Academy of Sciences)
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10:40
The Research of Polarization in CdTe P-I-N Detectors and Development of Detecting Units for High Resolution Spectroscopy
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Yury Petukhov
(Center of Radiation and Nuclear Safety (RNIIRP) Ltd)
-
10:40
Duo-lateral 2D position-sensitive radiation (particle) detectors made of single crystal CVD diamond
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Michal Pomorski
(CEA-Sacaly)
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10:40
Planar Si(Li) detectors with a large active volume
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Viacheslav Sandukovsky
(Joint Institute for Nuclear Rsearch)
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10:40
Simulative analysis of Backscatter Factors(BSFs) for low energy X-ray
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Sunwoo Yuk
(Korea Orthopedic & Rehabilitation Engineering Center)
-
10:40
Improved Coincidence Rejection For Silicon Drift Detectors
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Richard Mott
(PulseTor LLC)
-
10:40
Modelling the generation and dynamics of signal electrons in pixelized Si X-ray detectors
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Georg Weidenspointner
(HLL - MPI Halbleiterlabor)
-
10:40
Comparative study of PIN photodiodes for a low energy X-ray sensor between manufactured with three diverse wafer resistivity
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Shin-Woong Park
(Korea University)
-
10:40
NIR sensitivity enhancement by Laser Treatment for Si Detectors
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Koei Yamamoto
(Hamamatsu Photonics k.k)
-
10:40
Nano5 - advancing radiation and particle transport schemes in Geant4
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Georg Weidenspointner
(HLL - MPI Halbleiterlabor)
-
10:40
Epitaxial GaAs for X-ray detection
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Jacques Bourgoin
(GESEC R&D Inc.)
-
10:40
Temperature dependence of AlGaAs soft X-ray detectors
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Aidan Matthew Barnett
(University of Leicester)
-
10:40
Study of frequency-dependent interstrip admittance in silicon microstrip detectors
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Gabriele Giacomini
(FBK-irst)
-
10:40
Computer Simulation of Radiation Defect in Nanosandwich for Detection Applications
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Arkady Ilyin
(Kazakh National University)
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10:40
Surface morphology and structure of porous silicon fabricated by vapor phase chemical etching
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Diana Adliene
(Kaunas University of Technology)
-
10:40
Theoritical characterization of neutron semiconductor detector
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Djelloul Benzaid
-
10:40
Full differential front-end electronic for CMOS detectors.
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Piotr Sitek
-
10:40
A Fast Event-Preprocessor and Sequencer for the Simbol-X Low Energy Detector
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Chris Tenzer
(University of Tuebingen)
-
10:40
Enhanced radiation tolerance of Si detectors by addition of gold impurities: A simulation study
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Ariel Pablo Cedola
(National University of La Plata)
-
10:40
The van Roosbroeck system, its mathematical properties, their use in simulation tools, and detector simulation examples
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Klaus Gärtner
(WIAS-Berlin)
-
10:40
Impact of detector parameters on Light Charged Particle identification through pulse-shape analysis
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Andrea Castoldi
(Politecnico di Milano)
-
10:40
Capacitance and electric field analytical calculations in strip semiconductor detectors
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Paolo Walter Cattaneo
(INFN Pavia)
-
10:40
Noise analysis of the Charge Sensitive Amplifier(CSA) for Photodetection
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Shin-Woong Park
(Korea University)
-
10:40
Characterisation of an adaptive gain silicon microstrip readout chip.
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Aldo Mozzanica
(Paul Scherrer Institut)
-
10:40
The readout electronics for eROSITA pnCCD testing
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Johannes Elbs
(MPI Halbleiterlabor)
-
10:40
Comparison of events reconstruction techniques in imaging detectors based on signal sharing
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Carlo Fiorini
(Politecnico di Milano - INFN)
-
10:40
Readout ASICs for Silicon Drift Detectors
-
Carlo Fiorini
(Politecnico di Milano - INFN)
-
10:40
Proposal of a fast readout logic for large pixel devices
-
Alessandro Gabrielli
(INFN and University of Bologna)
-
10:40
Current Readout strategy for XFEL DEPFET detector
-
Carlo Fiorini
(Politecnico di Milano - INFN)
-
10:40
Introducing 65 nm CMOS technology in low-noise read-out of semiconductor detectors
-
Massimo Manghisoni
(University of Bergamo)
-
10:40
DAQ system for pixel detectors R&D
-
Piero Giubilato
(LBNL)
-
10:40
Study of p-type fast neutron irradiated silicon diodes
-
Oleksiy Lytovchenko
(INFN, Padova)
-
10:40
Performance of n^+-in-n Pixel Sensors at Highest Fluences
-
Daniel Muenstermann
(TU Dortmund)