16th International Workshop on DEPFET Detectors and Applications

Name: 16th International Workshop on DEPFET Detectors and Applications
Start: 2014-05-25T15:00:00+00:00
End: 2014-05-28T13:30:00+00:00
Location: Kloster Seeon

25–28 May 2014

Kloster Seeon

UTC timezone

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Detailed Timeable
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Accommodation and Travel

Support: Patricia and Laci

pas@hll.mpg.de
lca@hll.mpg.de

Testing of EMCM-3-2 on Wafer Level

26 May 2014, 11:30

30m

Tagungsraum (Kloster Seeon)

Tagungsraum

Kloster Seeon

Klosterweg 1 D-83370 Seeon

PXD9 Update, Metal System Optimization, Sensor Testing

Andreas Ritter (Max-Planck-Institut für Physik - Halbleiterlabor)

Slides

ATG_Testing.pdf

16th International Workshop on DEPFET Detectors and Applications

Support: Patricia and Laci

Testing of EMCM-3-2 on Wafer Level

Tagungsraum

Kloster Seeon

Speaker

Presentation materials

Choose timezone

16th International Workshop on DEPFET Detectors and Applications

Support: Patricia and Laci

Speaker

Presentation materials