20th International Workshop on DEPFET Detectors and Applications

Name: 20th International Workshop on DEPFET Detectors and Applications
Start: 2016-05-11T15:00:00+00:00
End: 2016-05-14T13:30:00+00:00
Location: Kloster Seeon

11–14 May 2016

Kloster Seeon

UTC timezone

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Support: Laci and Patricia

lca@hll.mpg.de
pas@hll.mpg.de

ASIC optimization using DEPFET transistors as current source

13 May 2016, 09:20

20m

Tagungsraum (Kloster Seeon)

Tagungsraum

Kloster Seeon

Klosterweg 1 D-83370 Seeon

Lab Tests: Pilot Testing in the Lab

Mr Harrison Schreeck (University of Göttingen)

Mr Benjamin Schwenker (University of Göttingen) Jakob Haidl (MPP)

Slides

Seeon_schreeck.pdf

20th International Workshop on DEPFET Detectors and Applications

Support: Laci and Patricia

ASIC optimization using DEPFET transistors as current source

Tagungsraum

Kloster Seeon

Speaker

Primary author

Co-authors

Presentation materials

Choose timezone

20th International Workshop on DEPFET Detectors and Applications

Support: Laci and Patricia

Speaker

Primary author

Co-authors

Presentation materials