20th International Workshop on DEPFET Detectors and Applications

Name: 20th International Workshop on DEPFET Detectors and Applications
Start: 2016-05-11T15:00:00+00:00
End: 2016-05-14T13:30:00+00:00
Location: Kloster Seeon

11–14 May 2016

Kloster Seeon

UTC timezone

Overview
Timetable
Detailed Timeable
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Accommodation and Travel

Support: Laci and Patricia

lca@hll.mpg.de
pas@hll.mpg.de

PXD9 - Module Testing after SMD Assembly

13 May 2016, 09:40

15m

Tagungsraum (Kloster Seeon)

Tagungsraum

Kloster Seeon

Klosterweg 1 D-83370 Seeon

Lab Tests: Pilot Testing in the Lab

Mr Marçà Boronat Arevalo (IFIC)

Slides

ProbeCardStatus-MBoronat.pdf

20th International Workshop on DEPFET Detectors and Applications

Support: Laci and Patricia

PXD9 - Module Testing after SMD Assembly

Tagungsraum

Kloster Seeon

Speaker

Primary author

Presentation materials

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20th International Workshop on DEPFET Detectors and Applications

Support: Laci and Patricia

Speaker

Primary author

Presentation materials